In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus atmosphere
نویسندگان
چکیده
Structure and morphology of picene films under vacuum and O2 atmosphere were studied by in situ synchrotron X-ray scattering. We observed that picene films exhibit a highly oriented and ordered structure, which is similar to the one reported for picene single crystals. Furthermore, we found that the film structure determined under vacuum remains nearly unchanged under O2 atmosphere. The results provide new insights into a high hole mobility and O2 gas sensing mechanism previously reported for picene thin film-based organic field-effect transistors. 2012 Elsevier B.V. All rights reserved.
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